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Your search returned 38 records. Click on the hyperlinks to view further details of Titles.. |
Magazine Name : Ieee Transactions On Electron Devices
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Year : 2003 Volume number : 50 Issue: 04 |
A Spice Model For Thin-Film Transistors Fabricated On Grain-Enhanced Polysilicon Film
(Article)
Subject:
Bsim And Spice
,
Gbs
,
Milc
Author:
Singh
Jagar
page:
1103
-
1108
1.5-Nm Gate Oxide Cmos On (110) Surface-Oriented Si Substrate
(Article)
Subject:
1/F Noise
,
Cmos
,
Cutoff Frequency
Author:
Hisayo Sasaki
Momose
page:
1001
-
1008
Erratic Erase In Flash Memories-Part I: Basic Experimental Statistical Characterization
(Article)
Subject:
Erasing Operation
,
Flash Memories
Author:
Andrea
Chimenton
page:
1009
-
1014
Performance Projections Of Scaled Cmos Devices And Circuits With Strained Si-On-Sige Channels
(Article)
Subject:
Poly-Siga Gate
,
Scaled Cmos
Author:
Jerry G
Fossum
page:
1012
-
1049
Erratic Erase In Flash Memories- Part Ii: Dependence On Operating Conditions
(Article)
Subject:
Erasing Operation
,
Flash Memories
Author:
Andrea
Chimenton
page:
1015
-
1021
Auger Recombination-Enhanced Hot Carrier Degradation In Nmosfets With A Forward Substrate Bias
(Article)
Subject:
Auger Recombination
Author:
C-W
Tsai
page:
1022
-
1026
Mosfet Gate Leakage Modeling And Delection Guide For Alternative Gate Dielectrics Based On Leakage Considerations
(Article)
Subject:
Direct Tunneling
,
Gate Leakage Current
Author:
Yee-Chia
Yeo
page:
1027
-
1035
Impact Of Gate-Induced Drain Leakage On Retention Time Distribution Of 256 Mabit Dram With Negative Wordline Bias
(Article)
Subject:
Gate-Induced Drain Leakage
Author:
Minchen
Chang
page:
1036
-
1041
Substrate-Triggered Technique For On-Chip Esd Protection Design In A 0.18-Um Salicided Cmos Process
(Article)
Subject:
Electrostatic Discharge
Author:
Ming-Dou
Ker
page:
1050
-
1057
Nickel Induced Crystallization Of A-Si Gate Electrode At 500 C And Mos Capacitor Reliability
(Article)
Subject:
Capacitor Reliability
Author:
Amol R
Joshi
page:
1058
-
1062
Shot-Noise Reduction In Multiple-Quantum-Well Resonant Tunneling Diodes
(Article)
Subject:
Multiple Quantum Wells
Author:
Vincent
Pouyet
page:
1063
-
1068
Dc,Rf, Andmicrowave Noise Performance Of Algan-Gan Field Transistors Dependence Of Aluminum Concetration
(Article)
Subject:
Algan
,
Gan
,
Hemts
Author:
Wu
Lu
page:
1069
-
1074
Capacitance Of Abrupt One-Sided Heterojunctions
(Article)
Subject:
Capacitance
Author:
B
Sheinman
page:
1075
-
1080
Compact Distributed Rlc Interconnect Models-Part Iii: Transients In Dingle And Coupled Lines With Capacitive Load Termination
(Article)
Subject:
Bessel Functions
,
Crosstalk
Author:
Raguraman
Venkatesan
page:
1081
-
1093
Compact Distributed Rlc Interconnect Models-Part Iv: Unified Models For Time Delay, Crosstalk,And Repeater Insertion
(Article)
Subject:
Crosstalk
Author:
Raguraman
Venkatesan
page:
1094
-
1102
Mems Fingerprint Sensor Immune To Various Finger Surface Conditions
(Article)
Subject:
Fingerprint Image
,
Fingerprint Sensor
Author:
Norio
Sato
page:
1109
-
1116
Gain Increases Through End Of Life In Traveling Wave Tubes
(Article)
Subject:
Gain Control
Author:
Dan M
Goebel
page:
1117
-
1124
Characterization Of The Tunneling Insulator In Mim Cathodes By Low-Stress I-V Measurement
(Article)
Subject:
Cathodes
,
Current Measurement
Author:
Mutsumi
Suzuki
page:
1125
-
1130
240-325-Ghz Gaas Cw Fundamental-Mode Tunnett Diodes Fabricated With Molecular Layer Epitaxy
(Article)
Subject:
Millimeter-Wave Devices
Author:
Piotr
Plltka
page:
867
-
873
Dc Characterization Of An Inp-Ingaas Tunneling Emitter Bipolar Transistor (Tebt)
(Article)
Subject:
Ingap-Gaas
,
Offset Voltage
Author:
Chun-Yuan
Chen
page:
874
-
879
Optimization Of Auge-Ni-Au Ohmic Contacts For Gaas Mosfets
(Article)
Subject:
Gaas Mosfet
,
Ohmic Contact
Author:
Hung-Cheng
Lin
page:
880
-
885
Slow Trransients Observed In Algan/Gan Hfets: Effects Of Sin Passivation And Uv Iiiumination
(Article)
Subject:
Algan/Gan Hfets
,
Current Collapse
Author:
Goutam
Koley
page:
886
-
893
Design And Performance Of Tunnel Collector Hbts For Microwave Power Amplifiers
(Article)
Subject:
Gaas/Gainp
,
Heterojunction Bipolar Transistors
Author:
Rebecca J
Welty
page:
894
-
899
Field Dependence Of Impact Ionzation Coeffeicients In On0.53ga0.47as
(Article)
Subject:
Avalanche Breakdown
,
Avalanche Multiplication
Author:
Js
Ng
page:
901
-
905
Sillcon Epitaxial Layer Recombination And Generation Lifetime Chara Characterization
(Article)
Subject:
Carrier Lifetimes
,
Epitaxial Layers
Author:
D.K
Schroder
page:
906
-
912
Improve The Luminous Efficiency Of Ac Plasma Display By High-Frequency Driving On Address Electrodes
(Article)
Subject:
High Frequency
,
Luminous Efficacy
Author:
Yi-Mei
Li
page:
913
-
917
Silicon Planar Technology For Single-Photon Optical Detectors
(Article)
Subject:
Photon Counting
Author:
Emilio
Sciacca
page:
918
-
925
Static Characteristics Of A-Si:H Dual Gate Tfts
(Article)
Subject:
Amorphous Silicon
Author:
Peyman
Servati
page:
926
-
932
Current Limited Stresses Of Sio2 Gate Oxides With Conductive Atomic Force Microscope
(Article)
Subject:
Atomic Force Microscopy
Author:
Marc
Porti
page:
933
-
940
Elctrical Characteristics And Reliability Of Uv Transparent Si3 N4 Metal-Insulator-Metal (Mim Capacitors
(Article)
Subject:
Bi-Cmos
,
Capacitors
Author:
Ronald
Bolam
page:
941
-
944
Novel Ultrahigh-Density Flash Memory With A Stacked-Surrounding Gate Transistor (S-Sgt)Structured Cekk
(Article)
Subject:
Flash Memory
Author:
Tetsuo
Endoh
page:
945
-
951
Extension And Source Source/Drain Design For High- Perormance Finfet Devices
(Article)
Subject:
Transport
,
Double Gate
Author:
Jakub
Kedzierski
page:
952
-
958
Modeling Of Parasitic Capacitancesin Deep Submicrometer Conventional And High-K Dielectric Mos Transistors
(Article)
Subject:
Fringing Field
Author:
Nihar R
Mohapatra
page:
959
-
966
Localized Oxide Degradation In Ultrathin Gate Dielectric And Its Statistical Analysis
(Article)
Subject:
Gate Leakage Current
Author:
Wei Yip
Loh
page:
967
-
972
A New Method To Characterize Border Traps In Submicron Transistors Using Hystersis In The Drain Current
(Article)
Subject:
Border Traps
,
Hysteresis
Author:
K.N
Manjularani
page:
973
-
979
Optimal Global Interconnects For Gsi
(Article)
Subject:
Inductance
,
Interconnections
Author:
Azad
Naeemi
page:
980
-
987
High-Performance Strained-Sol Cmos Devices Using Thin Film Sige-On-Insulator Technology
(Article)
Subject:
Cmos
,
Itox
,
Mobility
Author:
Tomohisa
Mizuno
page:
988
-
994
Characterization Of Process-Induced Mobile Ions On The Data Retention In Flash Memory
(Article)
Subject:
Data Retention
,
Flash Memory
Author:
Jimmy Jih-Wei
Liou
page:
995
-
1000
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